0

SHOPPING CART

No items in your cart View cart

NEO Software System CD-ROM (NEO PI-R, NEO PI-3, NEO FFI-3)

Author(s): Paul T. Costa, Jr. and Robert R. McCrae
Publisher: PAR
SKU code: 681SW
In stock
Qualifications required
AU$801.00

Overview

The NEO Software System allows you to generate unlimited Interpretive Reports when you input responses from a completed print administration or administer the NEO PI-R, NEO-PI-3, or NEO-FFI-3 on-screen.

The NEO PI-R and NEO-PI-3 Interpretive Report includes a T-score profile and data table; validity indexes; a global description of the Five Factors with detailed interpretation of the individual facets; personality correlates with possible implications; clinical hypotheses regarding Axis II disorders with treatment implications; coping and defence mechanisms, cognitive processes and personal needs and motivations.

The software also generates NEO Style Graphs, which are designed for sharing with your client, and the new NEO Problems in Living Checklist.

The NEO Software System CD-ROM (NEO PI-R, NEO PI-3, NEO FFI-3) includes the NEO Software System CD-ROM (scores the NEO PI-R, NEO PI-3 and NEO FFI-3), with On-Screen Help and Quick Start Guide, and 5 BONUS on-screen administrations of the NEO-PI-3 and NEO-FFI-3.

NEO PI-R Sample Software System Interpretive Report

NEO PI-3 Sample Software System Summary Report

NEO PI-3 Sample Software System Interpretive Report

NEO FFI-3 Sample Software System Summary Report

NEO FFI-3 Sample Software System Interpretive Report

System Requirements

  • XP, Vista, 7, 8, 10
  • Mac users: install Windows in VirtualBox or BootCamp. Other virtual machine solutions (e.g., Parallels, VMWare) are not supported.
  • NTFS file system
  • CD-ROM drive for installation
  • Internet connection for activation and counter update

The following qualification is required to access this product. Please login or register to proceed

Please contact ACER Customer Service on 1800 338 402 (toll free) if you have any queries.

Create an account
Already registered, please login
Author(s): Paul T. Costa, Jr. and Robert R. McCrae