0

SHOPPING CART

No items in your cart View cart

Five-Factor Personality Inventory – Children (FFPI-C)

Author(s): Ronnie L. McGheem David J. Ehrler and Joseph A. Buckhalt
Publisher: Pro-ED USA, 2007
SKU code: PG_FFP

Overview

Purpose: Measure personality traits and dispositions in children and adolescents

Age: 9-18.11 years

Time: 15 to 40 minutes

Administration: Self, Individual or Group

The Five-Factor Personality Inventory — Children (FFPI-C) is based upon the Five Factor Model (previously known as Big Five Theory of Personality). It is a self-report inventory designed to measure personality traits and dispositions in children and adolescents, as well as adults.

The test contains 75 items, each of which has two opposing anchor statements. Respondents are to choose the statement that best represents their opinion and then make a qualitative decision on the degree of support for their choice by filing in one of five circles.

It is based on a modern five-factor personality theory, which concludes that five broad factors account for the majority of variance in the personality descriptors:

  1. Agreeableness — Subfacets include Trust, Straightforwardness, Altruism, Compliance, Modesty, and Tendermindedness
  2. Extraversion — Subfacets include Warmth, Gregariousness, Assertiveness, Activity, Excitement Seeking, and Positive Emotions
  3. Openness to Experience — Subfacets include Fantasy, Aesthetics, Feelings, Actions, Ideas, and Values
  4. Conscientiousness — Subfacets include Competence, Order, Dutifulness, Achievement Striving, Self-Discipline, Deliberation
  5. Emotional Regulation — Subfacets include Anxiety, Angry Hostility, Depression, Self-consciousness, Impulsiveness, and Vulnerability

The FFPI-C is an efficient method of identifying, evaluating, and describing social adjustment and academic performance difficulties in children and adolescents.

The following qualification is required to access this product. Please login or register to proceed

Please contact ACER Customer Service on 1800 338 402 (toll free) if you have any queries.

Create an account
Already registered, please login
Author(s): Ronnie L. McGheem David J. Ehrler and Joseph A. Buckhalt